Author(s): | Follath, R. and Schmidt, J. S. and Weigand, M. and Fauth, K. |
Book Title: | 10th International Conference on Synchrotron Radiation Instrumentation |
Volume: | 1234 |
Pages: | 323--326 |
Year: | 2010 |
Series: | {AIP Conference Proceedings} |
Publisher: | American Institute of Physics |
Bibtex Type: | Conference Paper (inproceedings) |
Address: | Melbourne, Australia |
DOI: | 10.1063/1.3463201 |
Electronic Archiving: | grant_archive |
Language: | eng |
BibTex
@inproceedings{escidoc:0375, title = {{The X-ray microscopy beamline UE46-PGM2 at BESSY}}, booktitle = {{10th International Conference on Synchrotron Radiation Instrumentation}}, volume = {1234}, pages = {323--326}, series = {{AIP Conference Proceedings}}, publisher = {American Institute of Physics}, address = {Melbourne, Australia}, year = {2010}, slug = {escidoc-0375}, author = {Follath, R. and Schmidt, J. S. and Weigand, M. and Fauth, K.} }