Modern Magnetic Systems
Article
2021
Xenon plasma focused ion beam milling for obtaining soft X-ray transparent samples
Author(s): | Mayr, S. and Finizio, S. and Reuteler, J. and Stutz, S. and Dubs, C. and Weigand, M. and Hrabec, A. and Raabe, J. and Wintz, S. |
Journal: | Crystals |
Volume: | 11 |
Number (issue): | 5 |
Pages: | 546 |
Year: | 2021 |
Publisher: | MDPI AG |
Bibtex Type: | Article (article) |
DOI: | 10.3390/cryst11050546 |
Address: | Basel, Switzerland |
Electronic Archiving: | grant_archive |
Language: | eng |
BibTex
@article{escidoc:3329333, title = {Xenon plasma focused ion beam milling for obtaining soft X-ray transparent samples}, journal = {Crystals}, volume = {11}, number = {5}, pages = {546}, publisher = {MDPI AG}, address = {Basel, Switzerland}, year = {2021}, slug = {escidoc-3329333}, author = {Mayr, S. and Finizio, S. and Reuteler, J. and Stutz, S. and Dubs, C. and Weigand, M. and Hrabec, A. and Raabe, J. and Wintz, S.} }