Physical Intelligence
Article
2003
Atomic force microscope probe based controlled pushing for nano-tribological characterization
| Author(s): | Sitti, Metin |
| Journal: | IEEE/ASME Transactions on Mechatronics |
| Volume: | 8 |
| Number (issue): | 3 |
| Year: | 2003 |
| Bibtex Type: | Article (article) |
| Electronic Archiving: | grant_archive |
BibTex
@article{sitti2003atomic,
title = {Atomic force microscope probe based controlled pushing for nano-tribological characterization},
journal = {IEEE/ASME Transactions on Mechatronics},
volume = {8},
number = {3},
year = {2003},
slug = {sitti2003atomic},
author = {Sitti, Metin}
}