Physical Intelligence
Article
2004
Atomic force microscope probe based controlled pushing for nanotribological characterization
| Author(s): | Sitti, Metin |
| Journal: | IEEE/ASME Transactions on mechatronics |
| Volume: | 9 |
| Number (issue): | 2 |
| Pages: | 343--349 |
| Year: | 2004 |
| Publisher: | IEEE |
| Bibtex Type: | Article (article) |
| Electronic Archiving: | grant_archive |
BibTex
@article{sitti2004atomic,
title = {Atomic force microscope probe based controlled pushing for nanotribological characterization},
journal = {IEEE/ASME Transactions on mechatronics},
volume = {9},
number = {2},
pages = {343--349},
publisher = {IEEE},
year = {2004},
slug = {sitti2004atomic},
author = {Sitti, Metin}
}