Atomic-Force Microscope

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Research Overview

X-Ray Spectroscopy

X-ray resonant magnetic reflectivity (XRMR)

Exchange Bias and pinned magnetic moments

Mysterious magnetism of ZnO

High Performance Permanent Magnets

X-Ray Magnetic Circular Dichroism (XMCD)

X-Ray Microscopy

Special SXM Techniques

MAXYMUS, our SXM at BESSY

Nano Magnonics

Magnetism in Antidot Lattices

First-Order Reversal Curves

Micromagnetic simulations

Dynamics of Magnonic Crystals

FM / HTc Superconductor Systems

Magnetic x-ray microscopy on high-Tc superconductors

Superconductor-ferromagnet heterostructures

Micro / Nano Optics

Spectroscopic Ellipsometry

Reactive Ion Etching

Direct Write Optical Lithography

Atomic Layer Deposition

Focused Ion Beam

Kinoform Lenses

Multilayer Fresnel Zone Plates

Fresnel Zone Plate

Scanning Transmission X-ray Microscopy

Nanostructured Films for Metrology

Hydrogen Storage

Hydrogen isotope separation

Hydrogen storage

Pressure composition isotherm PCT

Low-temperature adsorption

Low-temperature thermal desorption spectroscopy TDS

Research Facilities

Sample Preparation

Atomic-Force Microscope

MOKE

Light microscopes

Magnetometer

Cluster-XMCD

X-Ray Spectroscopes

Modern Magnetic Systems

Atomic-Force Microscope

Combined atomic-force microscope and magnetic-force microscope (AFM/MFM)