Umut T. Sanli is currently a postdoctoral researcher at the Max Planck Institute for Intelligent Systems. He received his B.Sc. from Anadolu University (Eskisehir/Turkey) in 2009 and M.Sc. from Christian Albrechts University (Kiel/Germany) in 2012, both in materials science and engineering. In 2013, he joined the Max Planck Institute for Intelligent Systems. During his Ph.D. studies, he developed several different types of X-ray optics using innovative approaches for advancing X-ray microscopy. Sanli is skilled in various nano-engineering and characterization techniques including atomic layer deposition, focused ion beam lithography, multi-photon lithography, ellipsometry, microscopy and spectroscopy using electrons and X-rays.

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