@article{escidoc:0114,
  title = {{Focused ion beam micromachining enables novel optics for X-ray microscopy}},
  journal = {{Microscopy and Microanalysis}},
  volume = {21},
  number = {Suppl 3},
  pages = {1983--1984},
  publisher = {Springer-Verlag New York},
  address = {New York, NY},
  year = {2015},
  slug = {escidoc-0114},
  author = {Keskinbora, K. and Sanli, U. and Gr\'event, C. and Hirscher, M. and Sch\"utz, G.}
}