@article{escidoc:0186,
  title = {{Element specific monolayer depth profiling}},
  journal = {{Advanced Materials}},
  volume = {26},
  number = {38},
  pages = {6554--6559},
  publisher = {Wiley VCH},
  address = {Weinheim},
  year = {2014},
  slug = {escidoc-0186},
  author = {Macke, S. and Radi, A. and Hamann-Borrero, J. E. and Verna, A. and Bluschke, M. and Br\"uck, S. and Goering, E. and Sutarto, R. and He, F. and Cristiani, G. and Wu, M. and Benckiser, E. and Habermeier, H.-U. and Logvenov, G. and Gauquelin, N. and Botton, G. A. and Kajdos, A. P. and Stemmer, S. and Sawatzky, G. A. and Haverkort, M. W. and Keimer, B. and Hinkov, V.}
}