Institute Homepage
Institute Homepage DE Sign In

Back

Modern Magnetic Systems Conference Paper 2001

Materials analysis with monolayer depth resolution using MeV ion beams

Author(s): Carstanjen, H. D.
Journal: {Journal of Materials Processing Technology}
Volume: 117
Year: 2001
Bibtex Type: Conference Paper (inproceedings)
Address: Las Vegas, USA
Electronic Archiving: grant_archive
Language: eng

BibTex 

@inproceedings{escidoc:0901,
  title = {{Materials analysis with monolayer depth resolution using MeV ion beams}},
  journal = {{Journal of Materials Processing Technology}},
  volume = {117},
  address = {Las Vegas, USA},
  year = {2001},
  slug = {escidoc-0901},
  author = {Carstanjen, H. D.}
}