@article{escidoc:3329333,
  title = {Xenon plasma focused ion beam milling for obtaining soft X-ray transparent samples},
  journal = {Crystals},
  volume = {11},
  number = {5},
  pages = {546},
  publisher = {MDPI AG},
  address = {Basel, Switzerland},
  year = {2021},
  slug = {escidoc-3329333},
  author = {Mayr, S. and Finizio, S. and Reuteler, J. and Stutz, S. and Dubs, C. and Weigand, M. and Hrabec, A. and Raabe, J. and Wintz, S.}
}