Materials Article 2009

Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy

Author(s): Dunlop, I. E. and Zorn, S. and Richter, G. and Srot, V. and Kelsch, M. and van Aken, P. A. and Skoda, M. and Gerlach, A. and Spatz, J. P. and Schreiber, F.
Journal: Thin Solid Films
Volume: 517
Number (issue): 6
Pages: 2048-2054
Year: 2009
Bibtex Type: Article (article)
DOI: 10.1016/j.tsf.2008.10.058
Electronic Archiving: grant_archive

BibTex

@article{escidoc:4123503,
  title = {Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy},
  journal = {Thin Solid Films},
  volume = {517},
  number = {6},
  pages = {2048-2054},
  year = {2009},
  slug = {escidoc-4123503},
  author = {Dunlop, I. E. and Zorn, S. and Richter, G. and Srot, V. and Kelsch, M. and van Aken, P. A. and Skoda, M. and Gerlach, A. and Spatz, J. P. and Schreiber, F.}
}