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In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire

2018

Article

zwe-csfm


Author(s): Shin, J. and Cornelius, T. W. and Labat, S. and Lauraux, F. and Richard, M. I. and Richter, G. and Blanchard, N. P. and Gianola, D. S. and Thomas, O.
Journal: Journal of Applied Crystallography
Volume: 51
Pages: 781-788
Year: 2018

Department(s): CSF Materials
Bibtex Type: Article (article)

DOI: 10.1107/S1600576718004910

BibTex

@article{escidoc:4123531,
  title = {In situ Bragg coherent X-ray diffraction during tensile testing of an individual Au nanowire},
  author = {Shin, J. and Cornelius, T. W. and Labat, S. and Lauraux, F. and Richard, M. I. and Richter, G. and Blanchard, N. P. and Gianola, D. S. and Thomas, O.},
  journal = {Journal of Applied Crystallography},
  volume = {51},
  pages = {781-788},
  year = {2018},
  doi = {10.1107/S1600576718004910}
}