Physical Intelligence Article 2003

Atomic force microscope probe based controlled pushing for nano-tribological characterization

Author(s): Sitti, Metin
Journal: IEEE/ASME Transactions on Mechatronics
Volume: 8
Number (issue): 3
Year: 2003
Bibtex Type: Article (article)
Electronic Archiving: grant_archive

BibTex

@article{sitti2003atomic,
  title = {Atomic force microscope probe based controlled pushing for nano-tribological characterization},
  journal = {IEEE/ASME Transactions on Mechatronics},
  volume = {8},
  number = {3},
  year = {2003},
  slug = {sitti2003atomic},
  author = {Sitti, Metin}
}