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Atomic force microscope probe based controlled pushing for nano-tribological characterization
@article{sitti2003atomic, title = {Atomic force microscope probe based controlled pushing for nano-tribological characterization}, journal = {IEEE/ASME Transactions on Mechatronics}, volume = {8}, number = {3}, year = {2003}, slug = {sitti2003atomic}, author = {Sitti, Metin} }