@article{3611,
  title = {Feature Selection for Trouble Shooting
  in Complex Assembly Lines},
  journal = {IEEE Transactions on Automation Science and Engineering},
  abstract = {The final properties of sophisticated products can
  be affected by many unapparent dependencies within the manufacturing
  process, and the products’ integrity can often only be
  checked in a final measurement. Troubleshooting can therefore
  be very tedious if not impossible in large assembly lines.
  In this paper we show that Feature Selection is an efficient tool for
  serial-grouped lines to reveal causes for irregularities in product
  attributes. We compare the performance of several methods for
  Feature Selection on real-world problems in mass-production of
  semiconductor devices.
  Note to Practitioners— We present a data based procedure
  to localize flaws in large production lines: using the results of
  final quality inspections and information about which machines
  processed which batches, we are able to identify machines which
  cause low yield.},
  volume = {4},
  number = {3},
  pages = {465-469},
  organization = {Max-Planck-Gesellschaft},
  school = {Biologische Kybernetik},
  month = jul,
  year = {2007},
  slug = {3611},
  author = {Pfingsten, T. and Herrmann, DJL. and Schnitzler, T. and Feustel, A. and Sch{\"o}lkopf, B.},
  month_numeric = {7}
}