@article{escidoc:3551297,
  title = {Voltage x-ray reflectometry: A method to study electric-field-induced changes to interfacial electronic structures},
  journal = {Physical Review Letters},
  volume = {131},
  number = {3},
  pages = {036201},
  publisher = {American Physical Society},
  address = {Woodbury, N.Y.},
  year = {2023},
  slug = {escidoc-3551297},
  author = {Ilse, S. E. and Sch{\"u}tz, Gisela and Goering, E.}
}