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Modelling of conductive atomic force microscope probes for scanning tunnelling microscope operation
@article{ozcan2012modelling, title = {Modelling of conductive atomic force microscope probes for scanning tunnelling microscope operation}, journal = {IET Micro \& Nano Letters}, volume = {7}, number = {4}, pages = {329--333}, publisher = {IET}, year = {2012}, slug = {ozcan2012modelling}, author = {Ozcan, O and Sitti, M} }