Physische Intelligenz Article 2004

Atomic force microscope probe based controlled pushing for nanotribological characterization

Author(s): Sitti, Metin
Journal: IEEE/ASME Transactions on mechatronics
Volume: 9
Number (issue): 2
Pages: 343--349
Year: 2004
Publisher: IEEE
Bibtex Type: Article (article)
Electronic Archiving: grant_archive

BibTex

@article{sitti2004atomic,
  title = {Atomic force microscope probe based controlled pushing for nanotribological characterization},
  journal = {IEEE/ASME Transactions on mechatronics},
  volume = {9},
  number = {2},
  pages = {343--349},
  publisher = {IEEE},
  year = {2004},
  slug = {sitti2004atomic},
  author = {Sitti, Metin}
}