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Atomic force microscope probe based controlled pushing for nanotribological characterization
@article{sitti2004atomic, title = {Atomic force microscope probe based controlled pushing for nanotribological characterization}, journal = {IEEE/ASME Transactions on mechatronics}, volume = {9}, number = {2}, pages = {343--349}, publisher = {IEEE}, year = {2004}, slug = {sitti2004atomic}, author = {Sitti, Metin} }