Modern Magnetic Systems Article 2020

In situ x-ray diffraction and spectro-microscopic study of ALD protected copper films

Author(s): Dogan, G. and Sanli, U. T. and Hahn, K. and Müller, L. and Gruhn, H. and Silber, C. and Schütz, G. and Grévent, C. and Keskinbora, K.
Journal: ACS Applied Materials and Interfaces
Volume: 12
Number (issue): 29
Pages: 33377--33385
Year: 2020
Publisher: American Chemical Society
Bibtex Type: Article (article)
DOI: 10.1021/acsami.0c06873
Address: Washington, DC
Electronic Archiving: grant_archive
Language: eng

BibTex

@article{escidoc:3257727,
  title = {In situ x-ray diffraction and spectro-microscopic study of ALD protected copper films},
  journal = {ACS Applied Materials and Interfaces},
  volume = {12},
  number = {29},
  pages = {33377--33385},
  publisher = {American Chemical Society},
  address = {Washington, DC},
  year = {2020},
  slug = {escidoc-3257727},
  author = {Dogan, G. and Sanli, U. T. and Hahn, K. and M{\"u}ller, L. and Gruhn, H. and Silber, C. and Sch{\"u}tz, G. and Gr\'event, C. and Keskinbora, K.}
}