Microstructural dependence of the fracture toughness of metallic thin films: A bulge test and atomistic simulation study on single-crystalline and polycrystalline silver films
2019
Article
zwe-csfm
Author(s): | Preiss, E. I. and Lyu, H. and Liebig, J. P. and Richter, G. and Gannott, F. and Gruber, P. A. and Goken, M. and Bitzek, E. and Merle, B. |
Journal: | Journal of Materials Research |
Volume: | 34 |
Number (issue): | 20 |
Pages: | 3483--3494 |
Year: | 2019 |
Department(s): | ZWE Materialien |
Bibtex Type: | Article (article) |
DOI: | 10.1557/jmr.2019.262 |
BibTex @article{escidoc:4123465, title = {Microstructural dependence of the fracture toughness of metallic thin films: A bulge test and atomistic simulation study on single-crystalline and polycrystalline silver films}, author = {Preiss, E. I. and Lyu, H. and Liebig, J. P. and Richter, G. and Gannott, F. and Gruber, P. A. and Goken, M. and Bitzek, E. and Merle, B.}, journal = {Journal of Materials Research}, volume = {34}, number = {20}, pages = {3483--3494}, year = {2019}, doi = {10.1557/jmr.2019.262} } |