Advances in EELS spectroscopy by using new detector and new specimen preparation technologies
2003
Article
zwe-csfm
Author(s): | Scheu, C. and Gao, M. and Van Benthem, K. and Tsukimoto, S. and Schmidt, S. and Sigle, W. and Richter, G. and Thomas, J. |
Journal: | Journal of Microscopy-Oxford |
Volume: | 210 |
Pages: | 16-24 |
Year: | 2003 |
Department(s): | ZWE Materialien |
Bibtex Type: | Article (article) |
DOI: | DOI 10.1046/j.1365-2818.2003.01181.x |
BibTex @article{escidoc:4123526, title = {Advances in EELS spectroscopy by using new detector and new specimen preparation technologies}, author = {Scheu, C. and Gao, M. and Van Benthem, K. and Tsukimoto, S. and Schmidt, S. and Sigle, W. and Richter, G. and Thomas, J.}, journal = {Journal of Microscopy-Oxford}, volume = {210}, pages = {16-24}, year = {2003}, doi = {DOI 10.1046/j.1365-2818.2003.01181.x} } |